IEEE - Institute of Electrical and Electronics Engineers, Inc. - Partial discharge occurrence induced by crack defect on GIS insulator operated at 1100 kV

Author(s): Hong-xin Ji ; Cheng-rong Li ; Guo-ming Ma ; Zhi-kai Pang ; Zhi-guo Tang ; Hao Wen ; Bo-yuan Cui
Sponsor(s): Nat. Natural Sci. Found. China
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2016
Volume: 23
Page(s): 2,250 - 2,257
ISSN (Paper): 1070-9878
DOI: 10.1109/TDEI.2016.7556501
Regular:

It was observed that partial discharges were not detected from GIS insulators with the crack defects operated at 1100 kV in the UHV substation in China. The question is that whether crack defects... View More

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