IEEE - Institute of Electrical and Electronics Engineers, Inc. - Research of nondestructive methods to test defects hidden within composite insulators based on THz time-domain spectroscopy technology

Author(s): L. Cheng ; L. Wang ; H. Mei ; Z. Guan ; F. Zhang
Sponsor(s): Nat. Natural Sci. Found. China
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2016
Volume: 23
Page(s): 2,126 - 2,133
ISSN (Paper): 1070-9878
DOI: 10.1109/TDEI.2016.7556487
Regular:

In this manuscript, we introduced a novel far-field nondestructive testing (NDT) for defects within composite insulators based on the terahertz time-domain spectroscopy (THz-TDS) technology.... View More

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