IEEE - Institute of Electrical and Electronics Engineers, Inc. - Electrode erosion and lifetime performance of a triggered corona-stabilized switch in SF6 at a repetition rate of 1 kHZ

Author(s): John M. Koutsoubis ; Katerina Thoma ; Scott J. Macgregor
Sponsor(s): Nat. Natural Sci. Found. China
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2016
Volume: 23
Page(s): 1,985 - 1,995
ISSN (Paper): 1070-9878
DOI: 10.1109/TDEI.2016.7556470
Regular:

This paper describes the work undertaken to investigate the electrode erosion and lifetime performance of an electrically triggered, corona stabilized (TCS) switch. The switch, which had a... View More

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