IEEE - Institute of Electrical and Electronics Engineers, Inc. - A test method of winding deformation excited by pseudorandom M-Sequences — Part I: Theory and simulation

Author(s): Yongfen Luo ; Jiaping Gao ; Peng Chen ; Lin Hu ; Yu Shen ; Ling Ruan
Sponsor(s): Nat. Natural Sci. Found. China
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2016
Volume: 23
Page(s): 1,605 - 1,612
ISSN (Paper): 1070-9878
DOI: 10.1109/TDEI.2016.005681
Regular:

A test method to detect winding deformation by using pseudorandom binary M-Sequence excitation signals is proposed. This broadband excitation signal and the corresponding response from the winding... View More

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