IEEE - Institute of Electrical and Electronics Engineers, Inc. - Photoinjection in MOS structures: Interference interferes with observation of band structure

Author(s): R.J. Powell ; C.R. Viswanathan ; S. Ogura
Sponsor(s): IEEE Publication
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 1970
Volume: 58
Page(s): 1,151 - 1,153
ISSN (Paper): 0018-9219
ISSN (Online): 1558-2256
DOI: 10.1109/PROC.1970.7873
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