IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Plus/Minus 45 Degree Dual-Polarized Base-Station Antenna With Enhanced Cross-Polarization Discrimination via Addition of Four Parasitic Elements Placed in a Square Contour

Author(s): Yu Luo ; Qing-Xin Chu ; Ding-Liang Wen
Sponsor(s): IEEE Antennas and Propagation Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2016
Volume: 64
Page(s): 1,514 - 1,519
ISSN (Paper): 0018-926X
ISSN (Online): 1558-2221
DOI: 10.1109/TAP.2016.2522463
Regular:

A novel method of enhancing cross-polarization discrimination (XPD) of a ±45° dual-polarized base-station antenna, by addition of four parasitic elements placed in a square contour, is presented.... View More

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