IEEE - Institute of Electrical and Electronics Engineers, Inc. - Adaptive Read Thresholds for NAND Flash

Author(s): Borja Peleato ; Rajiv Agarwal ; John M. Cioffi ; Minghai Qin ; Paul H. Siegel
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2015
Volume: 63
Page(s): 3,069 - 3,081
ISSN (Paper): 0090-6778
DOI: 10.1109/TCOMM.2015.2453413
Regular:

A primary source of increased read time on NAND flash comes from the fact that, in the presence of noise, the flash medium must be read several times using different read threshold voltages for... View More

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