IEEE - Institute of Electrical and Electronics Engineers, Inc. - Orthogonal Matching Pursuit on Faulty Circuits

Author(s): Yao Li ; Yuejie Chi ; Chu-Hsiang Huang ; Lara Dolecek
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2015
Volume: 63
Page(s): 2,541 - 2,554
ISSN (Paper): 0090-6778
DOI: 10.1109/TCOMM.2015.2422301
Regular:

With the wide recognition that modern nanoscale devices will be error-prone, characterization of reliability of information processing systems built out of unreliable components has become an... View More

Advertisement