IEEE - Institute of Electrical and Electronics Engineers, Inc. - Automatic Scanning System for Back-Side Defect of Steel Structure Using Magnetic Flux Leakage Method

Author(s): Kenji Sakai ; Koji Morita ; Yuta Haga ; Toshihiko Kiwa ; Katsumi Inoue ; Keiji Tsukada
Sponsor(s): IEEE Magnetics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2015
Volume: 51
Page(s): 1 - 3
ISSN (Paper): 0018-9464
ISSN (Online): 1941-0069
DOI: 10.1109/TMAG.2015.2453211
Regular:

An automatic nondestructive evaluation system using the magnetic-flux-leakage method was developed for detecting the back-side defects of large structures in order to realize fast detection... View More

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