IEEE - Institute of Electrical and Electronics Engineers, Inc. - Sequential Testing for Sparse Recovery

Author(s): Matthew L. Malloy ; Robert D. Nowak
Sponsor(s): IEEE Information Theory Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2014
Volume: 60
Page(s): 7,862 - 7,873
ISSN (Paper): 0018-9448
ISSN (Online): 1557-9654
DOI: 10.1109/TIT.2014.2363846
Regular:

This paper studies sequential methods for recovery of sparse signals in high dimensions. When compared with fixed sample size procedures, in the sparse setting, sequential methods can result in a... View More

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