IEEE - Institute of Electrical and Electronics Engineers, Inc. - A New Technique for the Characterization of Microwave Avalanche Diodes

Author(s): P.W. Shackle
Sponsor(s): IEEE Microwave Theory and Techniques Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 1970
Volume: 18
Page(s): 995 - 998
ISSN (Paper): 0018-9480
ISSN (Online): 1557-9670
DOI: 10.1109/TMTT.1970.1127392
Regular:

Sample theoretical arguments are used to show that at low current densities the negative-resistance properties of a packaged avalanche diode may be represented by only three parameters. These... View More

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