IEEE - Institute of Electrical and Electronics Engineers, Inc. - Research on High Sensitivity Caused by Broken 1-D Multilayer Stack Sensor Based on the Slow Bloch Mode

Author(s): Yajun Liu ; Rongxia Liu ; Zhenhong Jia
Sponsor(s): IEEE Lasers and Electro-Optics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2012
Volume: 24
Page(s): 2,163 - 2,165
ISSN (Electronic): 1941-0174
ISSN (Paper): 1041-1135
DOI: 10.1109/LPT.2012.2224102
Regular:

We propose a new porous silicon structure for the interfered 1-D photonic crystal (PhC) that constitutes a multilayer stack. The vertical multilayer stack porous silicon and the horizontal... View More

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