IEEE - Institute of Electrical and Electronics Engineers, Inc. - Anomaly Detection and Classification for PHM of Electronics Subjected to Shock and Vibration

Author(s): P. Lall ; P. Gupta ; A. Angral
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2012
Volume: 2
Page Count: 17
Page(s): 1,902 - 1,918
ISSN (Paper): 2156-3950
ISSN (Online): 2156-3985
DOI: 10.1109/TCPMT.2012.2207460
Regular:

Failures in electronics subjected to shock and vibration are typically diagnosed using the built-in self test (BIST) or using continuity monitoring of daisy-chained packages. The BIST, which is... View More

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