IEEE - Institute of Electrical and Electronics Engineers, Inc. - Highly Accelerated Life Testing of Embedded Planar Capacitors With Epoxy- ${\rm BaTiO}_{3}$ Nanocomposite Dielectric

Author(s): M. A. Alam ; M. H. Azarian ; M. G. Pecht
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2012
Volume: 2
Page Count: 7
Page(s): 1,580 - 1,586
ISSN (Paper): 2156-3950
ISSN (Online): 2156-3985
DOI: 10.1109/TCPMT.2012.2204994
Regular:

Highly accelerated life testing (HALT) was performed on embedded planar capacitors by subjecting these devices to elevated temperature and voltage aging conditions. The dielectric material of... View More

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