IEEE - Institute of Electrical and Electronics Engineers, Inc. - Electrical Properties and Reliability of ZnO-Based Nanorod Current Emitters

Author(s): I-Chuan Yao ; Pang Lin ; Sheng-He Huang ; Tseung-Yuen Tseng
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2012
Volume: 2
Page Count: 8
Page(s): 1,143 - 1,150
ISSN (Paper): 2156-3950
ISSN (Online): 2156-3985
DOI: 10.1109/TCPMT.2012.2194494
Regular:

The fabrication, optical, and field emission properties of ZnO-based nanorod emitters were studied. Ga-doped ZnO nanorods combined with the formation of tip structure on top of a ZnO nanorod by... View More

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