IEEE - Institute of Electrical and Electronics Engineers, Inc. - Random Rough Surface Effects in Waveguides Using Mode Matching Technique and the Method of Moments

Author(s): Ruihua Ding ; Leung Tsang ; H. Braunisch
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2012
Volume: 2
Page Count: 9
Page(s): 140 - 148
ISSN (Paper): 2156-3950
ISSN (Online): 2156-3985
DOI: 10.1109/TCPMT.2011.2175923
Regular:

To address the rough surface effects in high speed interconnects on printed circuit boards and microelectronic packages, we study the electromagnetic wave propagation in a parallel plate waveguide... View More

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