IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Contact-Resistive Random-Access-Memory-Based True Random Number Generator

Author(s): Chien-Yuan Huang ; Wen Chao Shen ; Yuan-Heng Tseng ; Ya-Chin King ; Chrong-Jung Lin
Sponsor(s): IEEE Electron Devices Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2012
Volume: 33
Page Count: 3
Page(s): 1,108 - 1,110
ISSN (Paper): 0741-3106
ISSN (Online): 1558-0563
DOI: 10.1109/LED.2012.2199734
Regular:

A new type of true random number generator, based on the random telegraph noise of a contact-resistive random access memory device, is proposed in this letter. The random-number generator consists... View More

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