IEEE - Institute of Electrical and Electronics Engineers, Inc. - In-Depth Study on the Effect of Active-Area Scale-Down of Solution-Processed $\hbox{TiO}_{x}$

Author(s): Seungjae Jung ; Jaemin Kong ; Tae-Wook Kim ; Sunghoon Song ; Kwanghee Lee ; Takhee Lee ; Hyunsang Hwang ; Sanghun Jeon
Sponsor(s): IEEE Electron Devices Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2012
Volume: 33
Page Count: 3
Page(s): 869 - 871
ISSN (Paper): 0741-3106
ISSN (Online): 1558-0563
DOI: 10.1109/LED.2012.2190376
Regular:

The effect of active-area scale-down and improved memory performance of solution-processed TiO_x were investigated using devices with active areas ranging from 50 × 50 m2 to 200 × 200... View More

Advertisement