IEEE Computer Society - Employing the STDF V4-2007 Standard for Scan Test Data Logging

Author(s): M. Seuring ; M. Braun ; A. Ma ; G. Eide ; K. Yang ; Huaxing Tang
Sponsor(s): IEEE Computer Society
Publisher: IEEE Computer Society
Publication Date: 1 December 2012
Volume: 29
Page Count: 9
Page(s): 91 - 99
ISSN (Paper): 0740-7475
DOI: 10.1109/MDT.2012.2210533
Regular:

This paper focuses on the V4-2007 extension of the Standard Test Data Format (STDF). STDF has been used as the standard representation for logging test data from automatic test equipment (ATE).... View More

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