IEEE Computer Society - Asymmetric Aging and Workload Sensitive Bias Temperature Instability Sensors

Author(s): Min Chen ; V. Reddy ; S. Krishnan ; V. Srinivasan ; Yu Cao
Sponsor(s): IEEE Computer Society
Publisher: IEEE Computer Society
Publication Date: 1 October 2012
Volume: 29
Page Count: 9
Page(s): 18 - 26
ISSN (Paper): 0740-7475
DOI: 10.1109/MDT.2012.2210381
Regular:

Asymmetric aging under different workload profiles requires on-chip aging sensors to be sensitive to signal edge degradation. The authors in this paper present a 45-nm on-chip aging sensor that... View More

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