IEEE Computer Society - Scan-Based Speed-Path Debug for a Microprocessor

Author(s): Jing Zeng ; Michael A. Mateja ; Jing Wang ; Ruifeng Guo ; Wu-Tung Cheng
Sponsor(s): IEEE Computer Society
Publisher: IEEE Computer Society
Publication Date: 1 August 2012
Volume: 29
Page Count: 8
Page(s): 92 - 99
ISSN (Paper): 0740-7475
DOI: 10.1109/MDT.2012.2208353
Regular:

Identifying the actual speed limiting paths in silicon using traditional functional microprocessor tests can be very time-consuming and expensive because of limited observability of internal... View More

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