IEEE Computer Society - Testing of Stuck-Open Faults in Nanometer Technologies

Author(s): V. Champac ; J. V. Hernandez ; S. Barcelo ; R. Gomez ; C. Hawkins ; J. Segura
Sponsor(s): IEEE Computer Society
Publisher: IEEE Computer Society
Publication Date: 1 August 2012
Volume: 29
Page Count: 12
Page(s): 80 - 91
ISSN (Paper): 0740-7475
DOI: 10.1109/MDT.2012.2205609

Failure analysis and fault modeling of integrated circuits have always been fields that require continuous revision and update as manufacturing processes evolve. This paper discusses the new face... View More