IEEE Computer Society - Determining a Failure Root Cause Distribution From a Population of Layout-Aware Scan Diagnosis Results

Author(s): B. Benware ; C. Schuermyer ; M. Sharma ; T. Herrmann
Sponsor(s): IEEE Computer Society
Publisher: IEEE Computer Society
Publication Date: 1 February 2012
Volume: 29
Page Count: 11
Page(s): 8 - 18
ISSN (Paper): 0740-7475
DOI: 10.1109/MDT.2011.2178386
Regular:

The yield of an integrated circuit (IC) is well known to be a critical factor in the success of an IC in the market place. Achieving high stable yields helps ensure that the product is profitable... View More

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