IEEE - Institute of Electrical and Electronics Engineers, Inc. - Principal Line-Based Alignment Refinement for Palmprint Recognition

Author(s): Wei Li ; B. Zhang ; Lei Zhang ; Jingqi Yan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2012
Volume: 42
Page Count: 9
Page(s): 1,491 - 1,499
ISSN (Paper): 1094-6977
ISSN (Online): 1558-2442
DOI: 10.1109/TSMCC.2012.2195653
Regular:

Image alignment is an important step in various biometric authentication applications such as palmprint recognition. Most of the existing palmprint alignment methods make use of some key points... View More

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