IEEE - Institute of Electrical and Electronics Engineers, Inc. - Subsets of Primary Input Vectors in Sequential Test Generation for Single Stuck-at Faults

Author(s): I. Pomeranz
Sponsor(s): IEEE Council on Electronic Design Automation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2011
Volume: 30
Page Count: 5
Page(s): 1,579 - 1,583
ISSN (Paper): 0278-0070
ISSN (Online): 1937-4151
DOI: 10.1109/TCAD.2011.2157158
Regular:

The complexity of deterministic sequential test generation for a target fault in a circuit with n primary inputs is determined by the need to explore a search space that consists of... View More

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