IEEE - Institute of Electrical and Electronics Engineers, Inc. - Modeling the Maximum Throughput of Bluetooth Low Energy in an Error-Prone Link

Author(s): C. Gomez ; I. Demirkol ; J. Paradells
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2011
Volume: 15
Page(s): 1,187 - 1,189
ISSN (CD): 2373-7891
ISSN (Electronic): 1558-2558
ISSN (Paper): 1089-7798
DOI: 10.1109/LCOMM.2011.092011.111314
Regular:

We present an analytical model for the maximum throughput of Bluetooth Low Energy (BLE), considering the presence of uncorrelated bit errors and the impact of a key BLE parameter that defines the... View More

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