IEEE - Institute of Electrical and Electronics Engineers, Inc. - The transition-state pair method for test sequence generation

Proceedings of GLOBECOM '93. IEEE Global Telecommunications Conference

Author(s): Yu, S.S. ; Liu, M.T.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: Houston, TX, USA
Conference Date: 29 November 1993
ISBN (Paper): 0-7803-0917-0
DOI: 10.1109/GLOCOM.1993.318233
Regular:

In this paper, a new approach, called the Transition-State Pair (TSP) method, is proposed for test sequence generation. This method has been implemented using C. The major difference between the... View More

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