IEEE - Institute of Electrical and Electronics Engineers, Inc. - Cutting edge sharpness measurement using angle limited total integrated scattering

Proceedings of IECON '93 - 19th Annual Conference of IEEE Industrial Electronics

Author(s): Tang Wenyan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: Maui, HI, USA
Conference Date: 15 November 1993
ISBN (Paper): 0-7803-0891-3
DOI: 10.1109/IECON.1993.339316
Regular:

This paper describes a new method for measuring the cutting edge sharpness by using angle limited total integrated scattering (ALTIS). Using this method, the radius of the cutting edges can be... View More

Advertisement