IEEE - Institute of Electrical and Electronics Engineers, Inc. - Degradation Processes In Activated Autoemitters And Lfe Prediction Of Heating Free Magnetrons With Autoelectron Excitation

Proceedings of IEEE 6th International Vacuum Microelectronics Conference (IVMC)

Author(s): Kopylov, M.F.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: Newport, RI, USA
Conference Date: 12 July 1993
Page(s): 87 - 88
ISBN (Paper): 0-7803-0852-2
DOI: 10.1109/IVMC.1993.700291
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