IEEE - Institute of Electrical and Electronics Engineers, Inc. - Effect of contact resistivities and interface properties on the performance of SiC power devices

Author(s): Wang, T.K. ; Chow, T.P. ; Brown, D.M. ; Ghezzo, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1992
Conference Location: Tokyo, Japan
Conference Date: 19 May 1992
Page(s): 303 - 308
DOI: 10.1109/ISPSD.1992.991292
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