IEEE - Institute of Electrical and Electronics Engineers, Inc. - Bone texture characterization by oriented fractal analysis

Author(s): Jacquet, G. ; Ohley, W. ; Fortin, C.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1992
Conference Location: Kingston, RI, USA
Conference Date: 12 March 1992
Page(s): 22 - 23
ISBN (Paper): 0-7803-0902-2
DOI: 10.1109/NEBC.1992.285929
Regular:

The Hurst coefficient H can be interpreted as a measure of the texture contained within an image. In this work, the analysis of texture is applied to bone sections in an attempt to quantify... View More

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