IEEE - Institute of Electrical and Electronics Engineers, Inc. - A reliability analysis of schema processing in genetic algorithms

Author(s): Chakraborty, U.K. ; Dastidar, D.G. ; Roy, M.K.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1992
Conference Location: Melbourne, Vic., Australia
Conference Date: 11 November 1992
ISBN (Paper): 0-7803-0849-2
DOI: 10.1109/TENCON.1992.271979
Regular:

An analysis of schema processing in simple genetic algorithms is presented. The hazard function (instantaneous failure rate) of a schema under fitness-proportionate selection, single-point... View More

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