IEEE - Institute of Electrical and Electronics Engineers, Inc. - Thermal runaway-a system solution for a system problem

Author(s): McMenamin, D.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1992
Conference Location: Washington, DC, USA
Conference Date: 1 January 1992
Page(s): 18 - 21
ISBN (Paper): 0-7803-0779-8
DOI: 10.1109/INTLEC.1992.268469
Regular:

Thermal runaway is a potentially destructive failure mechanism known to exist in virtually all lead/acid batteries. It is more likely to occur in valve-regulated (also called sealed or maintenance... View More

Advertisement