IEEE - Institute of Electrical and Electronics Engineers, Inc. - Reliability testing of state-of-the-art PM HEMT MMICs three-stage low-noise amplifier

1992 GaAs IC Symposium Technical Digest

Author(s): Y. Saito ; W. Jones ; C.J. Lizandro ; K. Mai ; C. Perry ; J. Wiltz ; S. Claxton ; R. Esfandiari ; E. Rezek
Sponsor(s): IEEE
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1992
Conference Location: Miami Beach, FL, USA, USA
Conference Date: 4 October 1992
Page(s): 153 - 156
ISBN (Paper): 0-7803-0773-9
DOI: 10.1109/GAAS.1992.247202
Regular:

Reliability testing of three-stage, low-noise PM (pseudomorphic) HEMT (high-electron-mobility transistor) MMICs (monolithic microwave integrated circuits) was performed with constant stress... View More

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