IEEE - Institute of Electrical and Electronics Engineers, Inc. - Dependence of thermomagnetic mark size on applied STM voltage in Co-Pt multilayers

Author(s): L. Zhang ; J.A. Bain ; Jian-gang Zhu
Sponsor(s): IEEE Magnetics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2002
Volume: 38
Page Count: 3
Page(s): 1,895 - 1,897
ISSN (Paper): 0018-9464
ISSN (Online): 1941-0069
DOI: 10.1109/TMAG.2002.801781
Regular:

A method of heat-assisted magnetic recording potentially suitable for proposed probe-based storage systems is characterized. In this paper, a scanning tunneling microscope (STM) is used as the... View More

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