IEEE - Institute of Electrical and Electronics Engineers, Inc. - Comprehensive model of magnetization curve, hysteresis loops, and losses in any direction in grain-oriented Fe-Si

Author(s): F. Fiorillo ; L.R. Dupre ; C. Appino ; A.M. Rietto
Sponsor(s): IEEE Magnetics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2002
Volume: 38
Page Count: 10
Page(s): 1,467 - 1,476
ISSN (Paper): 0018-9464
ISSN (Online): 1941-0069
DOI: 10.1109/20.999119
Regular:

We report an investigation and theoretical assessment of the DC magnetic properties of high-permeability grain-oriented (GO) Fe-Si laminations under variously directed applied fields. We verified... View More

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