IEEE - Institute of Electrical and Electronics Engineers, Inc. - Dynamic scan: driving down the cost of test

Author(s): S. Samaranayake ; N. Sitchinava ; R. Kapur ; M.B. Amin ; T.W. Williams
Sponsor(s): IEEE Computer Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2002
Volume: 35
Page Count: 6
Page(s): 63 - 68
ISSN (Paper): 0018-9162
DOI: 10.1109/MC.2002.1039519
Regular:

Two factors primarily drive the soaring cost of semiconductor test: the number of test patterns applied to each chip and the time it takes to run each pattern. Typical semiconductor testing for... View More

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