IEEE - Institute of Electrical and Electronics Engineers, Inc. - SBT soft fault diagnosis in analog electronic circuits: a sensitivity-based approach by randomized algorithms

Author(s): C. Alippi ; M. Catelani ; A. Fort ; M. Mugnaini
Sponsor(s): IEEE Instrumentation and Measurement Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2002
Volume: 51
Page Count: 10
Page(s): 1,116 - 1,125
ISSN (Paper): 0018-9456
ISSN (Online): 1557-9662
DOI: 10.1109/TIM.2002.806004
Regular:

This paper addresses the fault diagnosis issue based on a simulation before test philosophy in analog electronic circuits. Diagnosis, obtained by comparing signatures measured at the test nodes... View More

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