IEEE - Institute of Electrical and Electronics Engineers, Inc. - ADC characterization based on singular value decomposition

Author(s): Jian Qiu Zhang ; S.J. Ovaska
Sponsor(s): IEEE Instrumentation and Measurement Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 February 2002
Volume: 51
Page Count: 6
Page(s): 138 - 143
ISSN (Paper): 0018-9456
ISSN (Online): 1557-9662
DOI: 10.1109/19.989917
Regular:

A new method for ADC characterization, based on singular value decomposition, is introduced in this paper. Here, the singular values of the sampled data matrix, directly derived from the measured... View More

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