IEEE - Institute of Electrical and Electronics Engineers, Inc. - Metrological analysis of the LIDFT method

Author(s): J. Borkowski ; J. Mroczka
Sponsor(s): IEEE Instrumentation and Measurement Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 February 2002
Volume: 51
Page Count: 5
Page(s): 67 - 71
ISSN (Paper): 0018-9456
ISSN (Online): 1557-9662
DOI: 10.1109/19.989903
Regular:

The estimation error components in the DFT linear interpolation (LIDFT) method have been presented in the paper. The equations for random errors, total error, the minimum and optimal parameter... View More

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