IEEE - Institute of Electrical and Electronics Engineers, Inc. - Elemental strain and trapped space charge in thermoelectrical aging of insulating materials: life modeling

Author(s): G. Mazzanti ; G.C. Montanari ; L.A. Dissado
Sponsor(s): Nat. Natural Sci. Found. China
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2001
Volume: 8
Page Count: 6
Page(s): 966 - 971
ISSN (Paper): 1070-9878
DOI: 10.1109/94.971453
Regular:

On the basis of the new concept of elemental strain, used to describe a possible aging process occurring in polymeric materials, the expression for the life model, already proposed in a previous... View More

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