IEEE - Institute of Electrical and Electronics Engineers, Inc. - An on-chip march pattern generator for testing embedded memory cores

Author(s): Wei-Lun Wang ; Kuen-Jong Lee ; Jhing-Fa Wang
Sponsor(s): IEEE Computer Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2001
Volume: 9
Page Count: 6
Page(s): 730 - 735
ISSN (Paper): 1063-8210
ISSN (Online): 1557-9999
DOI: 10.1109/92.953506
Regular:

In this correspondence, we propose an effective approach to integrate 40 existing march algorithms into an embedded low hardware overhead test pattern generator to test the various kinds of... View More

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