IEEE - Institute of Electrical and Electronics Engineers, Inc. - Defect-oriented test scheduling

Author(s): W. Jiang ; B. Vinnakota
Sponsor(s): IEEE Computer Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2001
Volume: 9
Page Count: 12
Page(s): 427 - 438
ISSN (Paper): 1063-8210
ISSN (Online): 1557-9999
DOI: 10.1109/92.929577
Regular:

As tester complexity and cost increase, reducing test time is an important manufacturing priority. Test time can be reduced by ordering tests so as to fail defective units early in the test... View More

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