IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analysis of EEG-EP variabilities: a parametric approach

Author(s): Gulcur, H.O. ; Demiralp, T.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1992
Conference Location: Istanbul, Turkey
Conference Date: 18 August 1992
Page(s): 86 - 91
ISBN (Paper): 0-7803-0743-7
DOI: 10.1109/IBED.1992.247088
Regular:

A user friendly Evoked Potential (EP) analysis software is developed, which include data processing procedures relevant to both basic EP research and routine clinical applications. The software... View More

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