IEEE - Institute of Electrical and Electronics Engineers, Inc. - Robust design and yield enhancement of low-voltage CMOS analog integrated circuits

Author(s): T.B. Tarim ; M. Ismail ; H.H. Kuntman
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2001
Volume: 48
Page Count: 12
Page(s): 475 - 486
ISSN (Paper): 1057-7122
DOI: 10.1109/81.917984
Regular:

Basic CMOS low-voltage analog cells are introduced and used in the design of low-voltage CMOS multipliers. A statistical design flow for enhancing the parametric functional yield of these... View More

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