IEEE - Institute of Electrical and Electronics Engineers, Inc. - High-resolution phase sampled interferometry using symmetrical number systems

Author(s): P.E. Pace ; D. Wickersham ; D.C. Jenn ; N.S. York
Sponsor(s): IEEE Antennas and Propagation Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2001
Volume: 49
Page Count: 13
Page(s): 1,411 - 1,423
ISSN (Paper): 0018-926X
ISSN (Online): 1558-2221
DOI: 10.1109/8.954930
Regular:

This paper identifies a new phase sampling interferometer approach that can he easily incorporated into the established techniques to provide a high resolution, small-baseline array with a fewer... View More

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