IEEE - Institute of Electrical and Electronics Engineers, Inc. - A rigorous UTD analysis of electromagnetic scattering from tapered resistive-loaded conducting strips

Author(s): Casanova, D.H. ; Joseph, P.J. ; Haupt, R.L.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1992
Conference Location: Chicago, IL, USA
Conference Date: 18 June 1992
ISBN (Paper): 0-7803-0730-5
DOI: 10.1109/APS.1992.221798
Regular:

The authors investigate a more accurate UTD (uniform theory of diffraction) solution to scattering from tapered resistive-loaded conducting strips using a rigorous formulation introduced by R.G.... View More

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