IEEE - Institute of Electrical and Electronics Engineers, Inc. - Contribution of double interaction between edges and facets to monostatic RCS of complex targets

Author(s): Domingo, M. ; Torres, R.P. ; Catedra, M.F.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1992
Conference Location: Chicago, IL, USA
Conference Date: 18 June 1992
ISBN (Paper): 0-7803-0730-5
DOI: 10.1109/APS.1992.221797
Regular:

A method to calculate the effect of double interaction between edges and plane facets is presented. The calculation is made by combining the equivalent currents method and geometrical optics. The... View More

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