IEEE - Institute of Electrical and Electronics Engineers, Inc. - The determination of dielectric properties at near millimetre wavelengths

Author(s): Birch, J.R.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1992
Conference Location: Chicago, IL, USA
Conference Date: 18 June 1992
ISBN (Paper): 0-7803-0730-5
DOI: 10.1109/APS.1992.221411
Regular:

Summary form only given. The author discussed methods used for dielectric measurements on solids at near millimeter wavelengths over a range of temperatures from 4.2 to values in excess of 1500 K.... View More

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