IEEE - Institute of Electrical and Electronics Engineers, Inc. - Investigation of arcing effects during contact blow open process

Author(s): Xin Zhou ; P. Theisen
Sponsor(s): IEEE Components, Packaging, and Manufacturing Technology Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2000
Volume: 23
Page Count: 7
Page(s): 271 - 277
ISSN (Paper): 1521-3331
ISSN (Online): 1557-9972
DOI: 10.1109/6144.846764
Regular:

A theoretical model has been developed to simulate the blow open process considering contact constriction force, contact spring force, and plasma pressure. Meanwhile, monochromatic high speed... View More

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